SURAGUS Material Testing

The SURAGUS Material Testing GmbH is a subsidary of the SURAGUS GmbH. While SURAGUS is developing and manufacturing measurement devices for various industries like semiconductors, photovoltaic, glass and others is the SURAGUS Material Testing GmbH responsible for sales activities in north america.

Our product portfolio consists of three areas. On the one hand we offer services around the measurement of samples and on the other hand the respective devices and systems which are needed for the measurement of samples or during production. Our feasibility studies show the customers of the SURAGUS GmbH whether a measurement with their devices is possible or not. Material Testing analyzes samples from customers who do not need their own equipment as part of our measurement service. However, the main task of Material Testing GmbH is to sell measuring instruments and systems.

Profile

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Product Picture Gallery

Type	Image	Product Name	Features	Go To
Handheld		EddyCus® TF portable	Small and portable measurement device Manual measurement Instant live measurement Digital data collection and data transmission via Bluetooth Characterization of hidden and encapsulated conductive layers	LINK
Single Point		EddyCus® TF lab 2020	Non-contact real time measurement Precise measurement of conductive thin films Characterization of hidden and encapsulated conductive layers Measurement data saving and export functions	LINK
Single Point		EddyCus® TF lab 2020RM	Customized sensor integration according measurement task (penetration depth, spot size, sensitivity) Measurement field: 200 x 200 mm; measurement in the center Positioning help for specimen User friendly software for data tracking and data export	LINK
Single Point		EddyCus® TF lab 4040	Non-contact, real time, robust Accurate and very repeatable measurements High measurement quality without influence No harm to sensitive layers Precise measurement No wearing Software guided manual mapping for systematic quality assurance Many measurement data saving and export functions Space saving smart monitor integration (for measurement per touch screen and data evaluation) Software development kit test automation using customer programs	LINK
Single Point		EddyCus® TF lab 4040A	Non-contact, real time, robust Accurate and very repeatable measurements High measurement quality without influence No harm to sensitive layers Precise measurement No wearing Software guided manual mapping for systematic quality assurance Many measurement data saving and export functions Space saving smart monitor integration (for measurement per touch screen and data evaluation) Software development kit test automation using customer programs	LINK
Single Point		EddyCus® TF lab 4040HS	Non-contact and simultaneous real-time measurement of sheet resistance and optical transparency One system This hybrid system requires less space than two separate systems Lower investment costs Fast and systematic characterization	LINK
Imaging Device		EddyCus® TF map 2525	Non-contact Fast and precise measurement High resolution mapping of conductive thin films Imaging of substrates up to 250 x 250 mm (10 x 10 inches) Defect detection and coating analysis Characterization even of hidden and encapsulated conductive layers Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis) Measurement data saving and export functions	LINK
Imaging Device		EddyCus® TF map 2530	Non-contact Fast and precise measurement High resolution mapping of conductive thin films Imaging of substrates up to 300 x 300 mm (12 x 12 inches) Characterization even of hidden and encapsulated conductive layers Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis) Measurement data saving and export functions Defect detection and coating analysis	LINK
Imaging Device		EddyCus® TF map 5050	Non-contact imaging Fast and accurate High resolution imaging with 1 mm pitch (alternatively 0.25 to 10 mm) Sampling areas of 500 x 500 mm (20 x 20 inches) Advanced layer uniformity analysis and defectoscopy Characterization of hidden and encapsulated conductive layers Profound software-integrated analysis functions (line profiles, histogram analysis, selective area analysis, statistics) Hybrid systems (e.g. combined electrical and optical imaging) Systematic quality control, incoming inspection, inspection of outgoing goods	LINK
Inline System		EddyCus® TF inline	Non-contact real time measurement High measurement speed up to 1,000 measurements/ sec. Fixed sensor installation or traversing sensor installation Integration of 1 – 99 monitoring lanes per system Process control at atmosphere or in vacuum Measurements very close to the edge of the substrate are possible in many applications Long term stability by temperature compensated measurements in changing environment Large distances to the testing material (e.g. gap of 60 mm / 2.4 inch) Characterization of covered conductive layers or encapsulated substrates Numerous software integrated analysis and statistic functions Easy set up by EddyCus RampUp software incl. wizard for system calibration Wear- free	LINK
Inline System		EddyCus® TF inline Sensorline	Non-contact real time measurement High measurement speed up to 50 measurements/ sec. Fixed sensor installation or traversing sensor installation Integration of 1 – 99 monitoring lanes per system Process control at atmosphere or in vacuum Measurements very close to the edge of the substrate are possible in many applications Long term stability by temperature compensated measurements in changing environment Large distances to the testing material (e.g. gap of 60 mm / 2.4 inch) Characterization of covered conductive layers or encapsulated substrates Numerous software integrated analysis and statistic functions Easy set up by EddyCus RampUp software incl. wizard for system calibration Wear- free	LINK

Contact Us

For product requests contact us by using email sales@suragus-testing.com or phone +49 351 32 111 520.